< Reliability of Future Automotive Semiconductors >

1. Date & Time: April 2, 2026 (Thu), 13:00 – 16:10

2. Venue: Suwon Convention Center, Room 104

3. Schedule:

13:00 – 13:40 / Semiconductor Technology Standards and Patents / Professor Seong-Hoon Jwa / Seoul National University of Science and Technology

13:50 – 14:30 / Case Studies of Automotive Semiconductor Reliability Standards / Senior Researcher Kyu-Bong Yeon / KATECH

14:40 – 15:20 / Test Methods for Automotive Semiconductors / Principal Researcher Lee Re / KTC

15:30 – 16:10 / Accelerated Life Evaluation of System Semiconductors / Principal Researcher Young-Bin Lee / KETI