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(SMTA Pac Pac 2026) Pan Pacific Strategic Electronics Symposium

관리자 2025-12-16 Number of views 375

Pan Pacific Strategic Electronics Symposium (SMTA Pac Pac 2026)

February 2-5, 2026  l  Big Island, Hawaii, USA


The Korea Packaging Integration Association (KPIA), as the Korean AG of the SMTA, organized a Korean session at Pan Pac 2026 to provide research information on advanced packaging and electronic packaging technologies which have emerged as core competitiveness in the semiconductor industry.

We anticipate this will be a platform for networking with global experts and sharing expertise and experience.

We look forward to your interest and participation.


< 2026 Technical Program >

The schedule is subject to change. Times listed below are in Standard Hawaiian Time.

  Monday, February 2

 
1:00pm 

 Registration Opens

Plenary Session
Session Chair: Michael Konrad, Aqueous Technologies

1:15pm-1:30pm 

Opening Remarks & Welcome
Mike Konrad, Conference Chairman

1:30pm-2:15pm

Immersive Lean Education:
Expanding Access to Experiential Manufacturing Training through 360° Virtual Modules

Tom Devall, Ph.D. & Jorge Valenzuela, Auburn University
2:15pm-2:25pm REFRESHMENT BREAK
2:25pm-3:05pm

Arctic Sea Ice Instrumentation
Savannah Byron, Dartmouth College

3:05pm-3:50pm

High-Temperature Storage Stability of PFAS and
Non-PFAS Potting Materials Interfaces under High-G Applications

Pradeep Lall, Ph.D., Auburn University

3:50pm-4:00pm REFRESHMENT BREAK
4:00pm-4:45pm

Conditional Mechanistic Weight Edits:
Targeted Real-Time Hallucination Reduction in LLMs
Jane Lackley, Cornell University & Hayden Lee, Bergen County Academies

4:45pm-5:30pm

Decoding the Aging Immune System:
Multi-Omic Insights and the Promise of Precision Medicine
Jessica Lasky-Su, Ph.D., Harvard Medical School / Women's Hospital 

5:30pm-6:30pm

Welcome Reception

  
  

  Tuesday, February 3

 

Session 1: Reliability & Quality 1
Session Chair: 

8:00am-8:30am

Jugaad Engineering – The INEMI FOS Corrosion Chamber
Prabjit Singh, Ph.D., PJ Consulting

8:30am-9:00am

Additively Manufactured SIR for On-Part Testing
Jaime Regis, Ph.D. & Danielle Foster, KCNSC/Honeywell FM&T

9:00am-9:30am

A New Assessment of Multilayer Ceramic Capacitor Crack Severity
Theron Lewis, P.E. IBM Corporation

9:30am-9:45am REFRESHMENT BREAK

Session 2: Reliability & Quality 2
Session Chair:

9:45am-10:15am

Integrated Analysis of Lock-In Thermography, X-Ray Computed Tomography, and Scanning Electron Microscopy for
Rapid Screening and Characterization of Defects in High-Density Semiconductor Packages
Yuji Inui, Ph.D., Resonac Corporation

10:15am-10:45am

Recent Progress and Remaining Challenges in Solid-State Design for Safe Energy Storage
Sierra Freitas, Dartmouth College

10:45am-11:15am

Reliability of Cu-Wrap and Braided Column CGAs for Extreme Cold Applications
Michael Hart, Topline Corporation

 11:15am-11:45am

Physics-Informed Machine Learning for Predicting IMC Growth in SAC305 Solder Joints under Thermal-Humidity Stress
Daryl Santos, Ph.D., Binghamton University

11:45am-12:30pmLUNCH BREAK

Session 3: Strategic Direction/Industry Roadmaps & Emerging Technologies
Session Chair: 

12:30pm-1:00pm

The Electron: A Biography
Ron Lasky, Ph.D., P.E., Indium Corporation

1:00pm-1:30pm

Understanding Technology Adoption Challenges in Manufacturing:
A Four-Year Longitudinal Analysis of U.S. SMMs
Ashley Yarbrough, Ph.D., Lipscomb University & Auburn University

1:30pm-2:00pm

Importance of Accreditation in Higher Education for the
International Comparability of Educational Qualifications
Kirsten Weide-Zaage, Leibniz Universität Hannover

2:00pm-2:30pm 


High Resolution Additive Manufacturing: A New Tool for Advancing Electronics
Rebecca Gallivan, Ph.D., Dartmouth College

  
  

  Wednesday, February 4

 

Session 4: Korea Packaging Integration Association
Session Chairs: Yoonchul Son, Chosun University & Hyunho Kim, KPIA 

8:00am-8:30am

Compare Reliability of BGA Package with Different Soldering Processes:
Reflow Soldering vs IPL Soldering
Seung-Boo Jung, Sungkyunkwan University 

8:30am-9:00am

Cu/SiO₂ Hybrid Bonding: Dielectric Interface Strengthening and Cu Oxide Suppression
Sungdong Kim, Seoul National University of Science and Technology

9:00am-9:30am

EUV-Cut-Free Tip-to-Tip Shrink by Directional Ion-Beam Etching for BEOL Interconnects
Jongsoon Park, Sungkyunkwan University

 9:30am-10:00am

Graphene-Based Multilayer Composites as a Promising Solution for Next-Generation EUV Pellicles
Yun Sung Woo, Dankook University

10:00am-10:15am REFRESHMENT BREAK

 Session 5: 3D Heterogeneous Integration & Nanotechnology
Session Chair:

10:15am-10:45am

Challenges With Large Area Ultra-High Density SIP
Jeffrey Kennedy, ZESTRON Corporation

10:45am-11:15am

Sintered Cu Paste as a Via-Filling Material for Through-Glass Via
Yoshinori Ejiri, Resonac Co., Ltd.

11:15am-11:45am

High Density Polymer RDL and Glass Core Interposers Based on a Plasma Dry Process for Scale-Up
Taku Hanna, Ph.D., ULVAC

11:45am-12:15pm

Optimization and Qualification of Nano Thin-Film Coating for RF Sensitive Aerospace Assemblies
Nishant Trivedi, Hughes Network Systems

12:15pm-1:15pmLUNCH BREAK
 

Session 6: Cleaning/Cleanliness Testing & Humidity Control
Session Chair:

1:15pm-1:45pm

Beyond the Golden Board: Real-World Evidence of Reflow Profile Temperature Drift and Residue Variability
Mike Konrad, Aqueous Technologies

1:45pm-2:15pm

Seeing the Invisible: A Non-Destructive Approach to Visualizing Flux Residues
Adam Klett, Ph.D., KYZEN Corporation

 2:15pm-2:45pm

Adiabatic & Isothermal Humidification for Electronics Manufacturing:
The Science of Humidity Control in Manufacturing
Ryk Williams, Carel USA

 2:45pm-3:15pm

Importance of Testing and Monitoring Different Types of Desiccants Used in the
Storage of Moisture Sensitive Devices Using Surface Insulation Resistance Methods
Terry Munson, Forsite Inc.

  
  

  Thursday, February 5

 

Session 7: Live Podcast Recording

8:00am-9:00am


Live Record
ing: The Reliability Matters Podcast Panel Discussion

AI in Action: Progress, Pitfalls, and the Future of Electronics
This panel will explore how AI is advancing manufacturing, the risks and workforce challenges that come with it, and the critical gaps where AI innovation is still needed. Join us for a concise, forward-looking discussion on where AI is helping, where it’s hurting, and where it must go next.

9:00am-9:15am REFRESHMENT BREAK
 

 Session 8: Reliability & Advanced Fabrication
Session Chair:

9:15am-9:45am

Effects of Aging on the Thermal Cycling Reliability of Ball Grid Array Assemblies
Jeffrey C. Suhling, Auburn University

9:45am-10:15am

From Fabric to Function: Textile-Based Sensors for Continuous Health Monitoring
Kaspar Jansen, TU Delft

10:15am-10:45am

Reliability Life Test of Additive Gravure Offset Electronics in Automotive Grade-3 Applications
Pradeep Lall, Ph.D., Auburn University

10:45am-11:00am REFRESHMENT BREAK

Session 9: Thermal Solutions & AI Inspection
Session Chair: 

11:00am-11:30am

Thermal Stress Finite Element Analysis of Carbon Foam Versus
Metallic Heat Sinks as a Thermal Management Solution for Integrated Circuits
Muhammad Ali, Ph.D., Ohio University

11:30am-12:00pm

Chiplet Packaging and AI Defect Inspection
Charles Woychik, Ph.D., NHanced Semiconductors

 12:00pm-12:30pm

Two-Phase Immersion-Cooled Data Centers
Charlie Polidoro, Inventec Performance Chemicals

12:30pm

Conferences Ends & Mai Tai Send-Off


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Symposium Packaging Integration Technology Seminar